Key Highlights
Configuration | 4/8 DUT per chassis |
Operation Modes | Manual loading / unloading. Parallel testing |
Control Software | TigerClaw software installed on external Control PC with Windows 11 Professional |
Memory Type Supported | DDR5 SDRAM 4/8/16/24 Gb, x4/8 width, 3DS configurations, Future support for 32/64 Gb |
Memory Speed Supported | DDR5-4000 DDR5-4200 DDR5-4400 DDR5-4600 DDR5-4800 DDR5-5000 DDR5-5200 DDR5-5400 DDR5-5600 DDR5-5800 DDR5-6000 DDR5-6200 DDR5-6400 |
Memory Types Supported | DDR5 288pin ECC RDIMM / 3DS ECC RDIMM, ECC-4bit and ECC-8bit |
Test Frequency | Clock2000 ~ 3200 MHz, adjustable by 100MHz increment |
Switching Data Rate | 4.0Gbps to 6.4Gbps,br> (5.6Gbps to 6.4Gbps only support 1 Rank RDIMM) Capable of data switching on both clock edges |
I/O Interface | DDR5 CK/CA/DQ/DQS/DM POD 1.1V RESETn CMOS 1.1V, PWR_GOOD open-drain pull-up to 3.3v SPD CMOS Push-pull 1.0V |
Temperature Control Chamber | Optional Heat chamber with digital temperature profile control up to 85°C Refer to Heat Chamber specifications for details |
… As a new entrant into the DRAM testing industry, HTSi has been using KingTiger’s test equipment to provide testing services for the majority of the DRAM industry.
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Hermes Testing Solutions Inc.
Technical Specifications
Address Generation | (17X + 11Y + 2BA + 3BG + 4CID) (X=Rows, Y=Columns, BA=Bank, BG=BankGroup, CID=ChipIDSelect) |
# of Rank Supported | RDIMM 2 physical rank, 3DS RDIMM 8 logical rank |
Data lines | 2-set 40bits |
Control Lines | 2-set CA/CSn/PAR set, 1-set ALERTn/RESETn |
DUT Clocks | 1 Differential Clocks |
Device Access Parameters | tCL, tCWL, tRCD, tRP, tRASmin, tREFI, tFAW, tRFC, tRFC2, tRFCsb, tRRD_L, tRRD_S, tRTP, tWR, tWTR_L, tWTR_S, tCCD_L, CmdRate Adjustable in nCLKs |
Refresh Control | Per row Refresh time adjustable from 1us up to 32768 memory clock periods |
Variable Timing Edges | Automatic training per rank and read/write – leveling to support fly-by topology |
Variable Test Voltage | VIN_BULK (DUT) 10.8V to 13.2V, 10mV increments, +/-(5mV + 0.5%), 5A max Shuts down when over-current is detected |
Current Measurement |
VIN_BULK Range Resolution Accuracy |
I2C/I3C Operations | I2C/I3C access to DUT Hub and downstream devices; such as PMIC, RCD, DB, TS |
Tests Available | Functional – Row Hammer, MarchA, MarchX, MarchC, MarchG, MATS, and many more industry standard tests. Application – ATSLWB, JumpLWB, Shift, MoveRot, MT64 Others – Rank Margin test, SPD test, IDDx |
SPD Operations | SPD Read, Write, Serialization, Import, Export, Address Check, Check Sum, Auto Setup , Program, Compare, Program Exclude, Compare Exclude, Hex View, Symbolic View |
Error Logging | Individual 80 DQ failures indicator Record last fail physical address (17X / 11Y / 2BA / 3BG) per rank per Pattern |
Other Features | Shmoo and Burn-in tools Comprehensive test flow control and binning control Speed Grading and Sorting support Test and Results Data logging capability Address Register Read Control |
Optional Features | PPR (Post Package Repair) Support On-Die ECC Monitor Device Core parameter Profiler DQ Eye Diagram |
… Galaxy’s belief is “Everything towards performance”. KingTiger’s KT-4MG+ PRO Memory tester is our strongest artifact to produce overclocked DDR4 Memory Modules.
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Testimonials From Galaxy
GALAXY Microsystems Ltd.
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