Device Testers

 

KT-4DG

kt4dg_product_page

  • Fully Automated ATE+Btt Single Step Device and application Tester
  • Btt up to 1.600Gbps, ATE up to 3Gbps
  • Hot Temperature Cycling by Handler
  • DDR4, and eMCP
  • Parallelism – 128 Duts, x16 Base

KT-3D

  • Fully Automated ATE+Btt Single Step Device and application Tester
  • Btt up to 1.600Gbps, ATE up to 2.133Gbps
  • Hot Temperature Cycling by Handler
  • DDR3, DDR4, LPDDR2, LPDDR3, and eMCP
  • Parallelism – 128 Duts, x16 Base

KT-3P

kt3p_product_page

  • Full DDR2 and DDR3 support
  • Easy to use, fully Programmable Pattern Generator (PPG Pro)
  • Address and Data Topology support
  • LRDIMM support
  • Up to 16 DDR2/3 modules tested in parallel Up to 256 devices in parallel
  • Handler interface available