- Fully Automated ATE+Btt Single Step Device and application Tester
- Btt up to 1.600Gbps, ATE up to 3Gbps
- Hot Temperature Cycling by Handler
- DDR4, and eMCP
- Parallelism – 128 Duts, x16 Base
- Fully Automated ATE + Btt Single Step Tester with speeds up to 3Gbps+ data rate!
- Models available for DIMM or Component Test
- Capable of handling all standard DDR4 DIMM configurations including LRDIMM
- Highly advanced system compatibility testing – ensure your DIMMs will work in your client’s systems
DDR2 memory technology has many new features that have created challenges for memory test engineers. Features like “on die termination” (ODT), differential DQS, higher frequency and lower voltage levels mean that older test equipment may not be sufficient for testing DDR2 devices.