- Fully Automated ATE+Btt Single Step Device and application Tester
- Btt up to 1.600Gbps, ATE up to 3Gbps
- Hot Temperature Cycling by Handler
- DDR4, and eMCP
- Parallelism – 128 Duts, x16 Base
DDR2 memory technology has many new features that have created challenges for memory test engineers. Features like “on die termination” (ODT), differential DQS, higher frequency and lower voltage levels mean that older test equipment may not be sufficient for testing DDR2 devices.