Device Testers
KT-4DG
- Fully Automated ATE+Btt Single Step Device and application Tester
- Btt up to 1.600Gbps, ATE up to 3Gbps
- Hot Temperature Cycling by Handler
- DDR4, and eMCP
- Parallelism – 128 Duts, x16 Base
KT-3D
- Fully Automated ATE+Btt Single Step Device and application Tester
- Btt up to 1.600Gbps, ATE up to 2.133Gbps
- Hot Temperature Cycling by Handler
- DDR3, DDR4, LPDDR2, LPDDR3, and eMCP
- Parallelism – 128 Duts, x16 Base
KT-3P
- Full DDR2 and DDR3 support
- Easy to use, fully Programmable Pattern Generator (PPG Pro)
- Address and Data Topology support
- LRDIMM support
- Up to 16 DDR2/3 modules tested in parallel Up to 256 devices in parallel
- Handler interface available
Module Testers
KT-5MRX
KingTiger’s lastest DDR5 RDimm High speed Tester has evolved with the market, the World`s only patented ATE/SLT dual-mode high speed Tester.
KT-5MU
- Manual loading / unloading. Parallel testing
- 2x 288-pin ZIF test sockets per chassis
- DDR5 ECC and non-ECC Un-buffered DIMM, capacity 32GB max.
- Over-clock memory frequency up to 4000MHz (DDR8000)
- Optional heat chamber with integrated test plan flow control
KT-4MG+ PRO
KingTiger’s lastest DDR4 Hybrid Module Tester has evolved with the market, now with automated Physical Memory Repair* and 4Gb X 4 devices on DIMM support.
*Note: Please refer the JEDEC standard, and the specification of your selected memory. Physical Memory Repair is an optional function in KT-4MG+ PRO.
KT-4MG+
KingTiger’s DDR4 Hybrid Module Tester with Physical Memory Repair*. The world’s only logical / application hybrid DRAM tester.
*Note: Please refer the JEDEC standard, and the specification of your selected memory. Physical Memory Repair is an optional function in KT-4MG+.
KT-3M
- Fully Automated ATE + Btt Single Step Module Tester with speeds up to 2.133MT/s
- Test During Burn-In (TDBI) High Temperature Chamber Available
- Capable of handling all DDR3 and DDR4 DIMM configurations
- Great for high volume production or engineering lab use
KT-3P
- Full DDR2 and DDR3 support
- Easy to use, fully Programmable Pattern Generator (PPG Pro)
- Address and Data Topology support
- LRDIMM support
- Up to 16 DDR2/3 modules tested in parallel Up to 256 devices in parallel
- Handler interface available
KT-2Pro
DDR2 memory technology has many new features that have created challenges for memory test engineers. Features like “on die termination” (ODT), differential DQS, higher frequency and lower voltage levels mean that older test equipment may not be sufficient for testing DDR2 devices.
FBDIMM KT-2P
Fully Buffered DIMM technology is fast becoming the Memory of Choice for high speed, high capacity computing applications. With I/O speeds reaching up to 4GHz, the emphasis on providing comprehensive, reliable and accurate testing data becomes increasingly important in the engineering and production success of your memory products. KTI’s FBDIMM KT-2P delivers these needs today.